🍩 Database of Original & Non-Theoretical Uses of Topology

(found 2 matches in 0.001067s)

  1. Topology-Aware Segmentation Using Discrete Morse Theory (2021)

    Xiaoling Hu, Yusu Wang, Li Fuxin, Dimitris Samaras, Chao Chen
    Abstract In the segmentation of fine-scale structures from natural and biomedical images, per-pixel accuracy is not the only metric of concern. Topological correctness, such as vessel connectivity and membrane closure, is crucial for downstream analysis tasks. In this paper, we propose a new approach to train deep image segmentation networks for better topological accuracy. In particular, leveraging the power of discrete Morse theory (DMT), we identify global structures, including 1D skeletons and 2D patches, which are important for topological accuracy. Trained with a novel loss based on these global structures, the network performance is significantly improved especially near topologically challenging locations (such as weak spots of connections and membranes). On diverse datasets, our method achieves superior performance on both the DICE score and topological metrics.

  2. A Novel Approach for Wafer Defect Pattern Classification Based on Topological Data Analysis (2023)

    Seungchan Ko, Dowan Koo
    Abstract In semiconductor manufacturing, wafer map defect pattern provides critical information for facility maintenance and yield management, so the classification of defect patterns is one of the most important tasks in the manufacturing process. In this paper, we propose a novel way to represent the shape of the defect pattern as a finite-dimensional vector, which will be used as an input for a neural network algorithm for classification. The main idea is to extract the topological features of each pattern by using the theory of persistent homology from topological data analysis (TDA). Through some experiments with a simulated dataset, we show that the proposed method is faster and much more efficient in training with higher accuracy, compared with the method using convolutional neural networks (CNN) which is the most common approach for wafer map defect pattern classification. Moreover, it was shown that our method outperforms the CNN-based method when the number of training data is not enough and is imbalanced.

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